2009年6月30日，
模型1040纳米磨机®TEM specimen preparation system was installed at the United States National Center for Electron Microscopy (NCEM) located at the Lawrence Berkeley National Laboratory (LBL) in June 2009. The NanoMill system was chosen to prepare the highest-quality samples for the Department of Energy’s Transmission Electron Aberration-Corrected Microscope (TEAM) microscope. Recognizing the benefit of the small diameter, inert gas ion beam, combined with low energy and low temperature operation, leading researcher Dr. Christian Kisielowski is using the NanoMillingSM处理在各种样品中，包括硬和软材料。